Ellipsometers
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Plasmos SD-2004 Multi-Wavelength Ellipsometer
Plasmos SD-2004 Multi-Wavelength Ellipsometer -
Nanometrics 8300XSE Film Thickness Analyzer
Nanometrics 8300XSE Film Thickness Analyzer
- J.A. Woollam M-44 Spectroscopic Ellipsometer
- J.A. Woollam EC-270 Ellipsometer Controller
- J.A. Woollam LPS-420 Xenon Light Source
- Manual Loading of up to 300mm Wafers
- Yaskawa ERCR-NS01-B004 Motion Controller
- Please Inquire for Additional Details
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Plasmos SD2000 Automatic Ellipsometer
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