Other Coordinate Measuring Machines
BROWN & SHARPE COORDINATE MEASURING MACHINE
Coordinate Measuring Machine
Metrology & Inspection Tools
-
-
Comparators
NIKON OPTICAL COMPARATOR
Optical Comparator
-
Hardness Testers
PACIFIC TRANSDUCER CORPORATION DUROMETER
Shore Type D Durometer
-
Profilometers
VEECO PROFILOMETER
Profilometer
-
Other Mechanical Inspection Equipment
PHYSICAL ACOUSTICS CORPORATION ACOUSTIC EMISSION SENSOR
Acoustic Emission Sensor Calibration certificate
-
Profilometers
VEECO PROFILOMETER
Profilometer
-
Ellipsometers
RUDOLPH RESEARCH ELLIPSOMETER 150MM
Ellipsometer
-
Ellipsometers
GAERTNER ELLIPSOMETER
Ellipsometer
Upgraded in 2004 by Gaertner
-
Other Metrology Equipment
DIGITAL INSTRUMENTS / VEECO ATOMIC FORCE MICROSCOPE NANOSCOPE IIIA
Atomic Force Microscope AFMScanning Probe Microscope SPM
Stage size: 300mm
Accessories:
- Stage Controller: NanoScope Model 5000C-1
- Scanning Probe Microscope Controller: NanoScope IIIA
- Vibration Isolation Table and Acoustic Enclosure
-
Interferometers
HEWLLET PACKARD 10706B
Plane Mirror Interferometer
-
Interferometers
NISSEI ELECTRIC CO. LTD INTERFEROMETER
Computer Controlled Lens Measurement System. Laser Interferometer This system was designed to measure the minute coefficients of the compensating lens that become the target for calculating the amount of stripe shift error.
The basic function is to measure lens based on NC data.
-
Ellipsometers
RUDOLPH RESEARCH ELLIPSOMETER 150MM
Ellipsometer